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Clinical Imaging of Microwave Mammography
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Microwave Near Field Imaging of Externally Injected Signals in an Encapsulated Electronic Device.

Qiang Zhu1, Yangfan Zhang1, Xin Li2

  • 1State Key Laboratory of Widegap Semiconductor Optoelectronic Materials and Technologies, North University of China, Taiyuan 030051, China.

Micromachines
|June 26, 2026
PubMed
Summary

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A Miniaturized Microwave Magnetometer with High Frequency Resolution Based on Diamond NV Centers for Multi-Microwave-Field Measurement.

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Laser-Assisted Diamond Cutting for Low-Damage Fabrication of High-Q CaF<sub>2</sub> Whispering-Gallery Mode Resonators.

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Laser-Assisted Diamond Turning for Anisotropy Suppression in Calcium Fluoride.

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Characterization of Interface Characteristics of Hexagonal Boron Nitride with Different Thicknesses Using Scanning Microwave Microscopy.

Langmuir : the ACS journal of surfaces and colloids·2025

This study introduces a non-destructive testing method using diamond nitrogen-vacancy (NV) centers for electromagnetic compatibility. The technique successfully maps microwave field distributions to identify internal connections in USB flash drives without damage.

Area of Science:

  • Quantum Sensing
  • Materials Science
  • Electrical Engineering

Background:

  • Miniaturized electronic devices present challenges in electromagnetic compatibility (EMC) testing and internal structure inspection.
  • Current non-destructive testing (NDT) methods may lack the resolution or specificity required for complex internal circuitry.

Purpose of the Study:

  • To develop and demonstrate a novel NDT method for EMC testing and internal structure analysis of miniaturized electronics.
  • To validate the technique's efficacy on a practical electronic component, a Universal Serial Bus (USB) flash drive.

Main Methods:

  • Utilized wide-field imaging based on diamond nitrogen-vacancy (NV) centers for quantum sensing.
  • Employed optically detected magnetic resonance (ODMR) to image microwave field distribution.
Keywords:
NV centerUSB flash drivenon-destructive testingquantum sensor

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  • Applied swept microwave signals (2.82 GHz to 2.97 GHz) to USB flash drive interface pins.

    • Main Results:

    • Successfully mapped microwave field distributions across signal lines within a 1x1 mm² region.
    • Demonstrated significant differences in field distributions for distinct interface channels.
    • Clearly identified the connection between signal lines and interface pins.
    • Revealed channel-specific field distribution variations and crosstalk characteristics.

    Conclusions:

    • The developed wide-field imaging method using diamond NV centers provides an effective NDT pathway for electronic products.
    • This technique enables non-destructive electromagnetic testing and functional verification of internal structures.
    • Offers a promising approach for quality control and failure analysis in miniaturized electronics.