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Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...

Electron Microscope Tomography and Single-particle Reconstruction

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: Aug 27, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Atomic-Scale Rectification and Inelastic Electron Tunneling Spectromicroscopy.

Jiang Yao¹, Peter J Wagner¹, Yunpeng Xia¹

¹Department of Physics and Astronomy, University of California, Irvine, California 92697-4575, United States.

|September 26, 2022

Summary

This summary is machine-generated.

Rectification, the generation of DC current from AC voltage, is closely linked to inelastic electron tunneling. Analyzing current-voltage curves reveals differences, highlighting complementary nanoscale probing techniques.

Keywords:

inelastic electron tunneling inelastic tunneling probe molecular vibrations rectification scanning tunneling microscope submolecular contrast

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Last Updated: Aug 27, 2025

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Area of Science:

Condensed Matter Physics
Molecular Electronics
Surface Science

Background:

Rectification, the DC current generation from AC voltage, is linked to nonlinear current-voltage (I(V)) characteristics.
Microscopic mechanisms of rectification are not fully understood.
Inelastic electron tunneling spectroscopy (IETS) and microscopy probe molecular properties via I(V) curves.

Purpose of the Study:

To investigate the connection between rectification and IETS for single molecules.
To differentiate rectification from IETS using nonlinear I(V) curve analysis.
To establish nonlinear conductivity spectromicroscopy as a tool for nanoscale systems.

Main Methods:

Utilized scanning tunneling microscopy (STM) to study single molecules.
Performed comprehensive line shape analyses of nonlinear I(V) curves.
Applied principles of inelastic electron tunneling spectroscopy and microscopy.

Main Results:

Demonstrated a close link between rectification and inelastic electron tunneling.
Identified distinct line shape features differentiating rectification and IETS.
Showcased nonlinear conductivity spectromicroscopy's capability for nanoscale analysis.

Conclusions:

Rectification and IETS are complementary techniques for probing nanoscale systems.
Nonlinear I(V) curve analysis provides insights into microscopic mechanisms.
STM-based nonlinear conductivity spectromicroscopy is effective for molecular electronics.