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Investigation of the Temperature Effect on Electrical Characteristics of Al/SiO2/n++-Si RRAM Devices

Piotr Wiśniewski1,2, Mateusz Nieborek1,3, Andrzej Mazurak3

  • 1Centre for Advanced Materials and Technologies CEZAMAT, Warsaw University of Technology, 02-822 Warsaw, Poland.

Micromachines
|October 27, 2022
PubMed

Keywords:
MISMOSRRAMSCLCTDDBWeibullmemristorresistive switchingsilicon oxidetemperature measurements

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