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Related Experiment Video

Updated: Aug 22, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

X-ray diffraction with micrometre spatial resolution for highly absorbing samples.

Prerana Chakrabarti¹, Anna Wildeis², Markus Hartmann²

¹Physics Department, University of Siegen, 57072 Siegen, Germany.

Journal of Synchrotron Radiation

|November 8, 2022

Summary

This summary is machine-generated.

This study introduces a new X-ray diffraction setup enabling microstructural analysis of highly absorbing materials. The advanced goniometer system achieves micrometer resolution at high photon energies, overcoming previous limitations.

Keywords:

X-ray diffraction X-ray fluorescence goniometers high photon energy high spatial resolution

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$Synthesis and Microdiffraction at Extreme Pressures and Temperatures$

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Published on: October 7, 2013

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Last Updated: Aug 22, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

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$Synthesis and Microdiffraction at Extreme Pressures and Temperatures$

Synthesis and Microdiffraction at Extreme Pressures and Temperatures

Published on: October 7, 2013

Area of Science:

Materials Science
Physics
Analytical Chemistry

Background:

X-ray diffraction (XRD) is vital for characterizing polycrystalline materials, including strain, stress, grain boundaries, and texture.
Previous limitations in XRD analysis involved highly absorbing samples and simultaneous X-ray fluorescence (XRF) of high-Z materials due to low photon energies.
Characterizing microstructural properties in complex or dense materials has remained a challenge.

Purpose of the Study:

To report a novel goniometer-based setup for high-resolution X-ray diffraction.
To enable microstructural and elemental analysis of highly absorbing samples using high photon energies.
To overcome limitations of previous X-ray techniques for materials characterization.

Main Methods:

Implementation of a goniometer-based setup at the P06 beamline of PETRA III.
Utilizing compound refractive lenses to achieve a highly focused X-ray beam.
Employing a 5D goniometer for high-precision sample manipulation (3 rotations, 2 translations).
Operating at photon energies of 35 keV and above for enhanced penetration.

Main Results:

Achieved micrometer spatial resolution for X-ray diffraction analysis.
Demonstrated local strain variation determination in martensitic steel samples.
Showcased simultaneous elemental distribution mapping for high-Z materials in thin-film solar cells.
Successfully analyzed highly absorbing samples, a previously challenging task.

Conclusions:

The developed setup significantly advances the capability for microstructural characterization of challenging materials.
This technique provides unprecedented insights into local strain and elemental composition.
It opens new avenues for materials science research, particularly for dense and high-Z materials.