X-ray diffraction with micrometre spatial resolution for highly absorbing samples

Area of Science:

• Materials Science
• Physics
• Analytical Chemistry

Background:

• X-ray diffraction (XRD) is vital for characterizing polycrystalline materials, including strain, stress, grain boundaries, and texture.
• Previous limitations in XRD analysis involved highly absorbing samples and simultaneous X-ray fluorescence (XRF) of high-Z materials due to low photon energies.
• Characterizing microstructural properties in complex or dense materials has remained a challenge.

Purpose of the Study:

• To report a novel goniometer-based setup for high-resolution X-ray diffraction.
• To enable microstructural and elemental analysis of highly absorbing samples using high photon energies.
• To overcome limitations of previous X-ray techniques for materials characterization.

Main Methods:

• Implementation of a goniometer-based setup at the P06 beamline of PETRA III.
• Utilizing compound refractive lenses to achieve a highly focused X-ray beam.
• Employing a 5D goniometer for high-precision sample manipulation (3 rotations, 2 translations).
• Operating at photon energies of 35 keV and above for enhanced penetration.

Main Results:

• Achieved micrometer spatial resolution for X-ray diffraction analysis.
• Demonstrated local strain variation determination in martensitic steel samples.
• Showcased simultaneous elemental distribution mapping for high-Z materials in thin-film solar cells.
• Successfully analyzed highly absorbing samples, a previously challenging task.

Conclusions:

• The developed setup significantly advances the capability for microstructural characterization of challenging materials.
• This technique provides unprecedented insights into local strain and elemental composition.
• It opens new avenues for materials science research, particularly for dense and high-Z materials.