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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Jintao Wang1,2,3, Ziwen Lv1,2,3, Luobin Zhang1,2,3
1Department of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, China.
A new chemical synthesis method produces cobalt-tin (CoSn3) nanoparticles, crucial for strengthening tin-based composite solder pastes used in electronic packaging. This advancement offers a reliable path for creating enhanced soldering materials.
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