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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Yoon Ho Jang1, Janguk Han1, Jihun Kim1
1Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, College of Engineering, Seoul National University, Seoul, 08826, Republic of Korea.
This study introduces a novel method using memristor crossbar arrays to analyze complex graph data. It leverages sneak currents to identify node similarities, enabling predictions of future connections and community structures in dynamic networks.
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