Edge effect of wide spectrum denoising in super-resolution microscopy

During the stochastic optical reconstruction microscope (STORM) raw image acquisition in super-resolution microscopy, noise is inevitable. Noise not only reduces the temporal and spatial resolution of the super-resolution image but also leads to the failure of super-resolution image reconstruction. Wide spectrum denoising (WSD) can effectively remove various random noises (such as Poisson noise and Gaussian noise) from the STORM raw image to improve the super-resolution image reconstruction. We found that there is an obvious edge effect in WSD, and its influence on STORM raw image denoising and super-resolution image reconstruction is studied. We then proposed the method of restraining edge effect. The simulation and real experiment results show that edge trimming can effectively suppress the edge effect, thus leading to better super-resolution image reconstruction.