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Updated: Aug 10, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Dexin Zhao1, Aniket Patel1, Aaron Barbosa1
1Department of Materials Science and Engineering, Texas A&M University, College Station, TX 77843, USA.
A new nano-scale residual elastic strain mapping method uses precession electron diffraction. This technique eliminates the need for a strain-free reference area, offering a more accessible approach for materials analysis.
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