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High-flexibility and high-accuracy phase delay calibration method for MEMS-based fringe projection systems
Optics Express
|February 14, 2023
Summary
This study introduces a new calibration method to fix distorted fringe patterns in laser beam scanning (LBS) projectors for 3D reconstruction. The technique improves 3D topographic reconstruction accuracy by compensating for MEMS mirror phase variations.
Area of Science:
- Optics and Photonics
- Mechanical Engineering
- Computer Vision
Background:
- Microelectromechanical system (MEMS) mirror based laser beam scanning (LBS) projectors are popular for fringe projection profilometry (FPP) due to their compact size and affordability.
- Variations in the initial phase of scanning MEMS mirrors cause unstable fringe patterns, degrading the accuracy of 3D topographic reconstruction.
Purpose of the Study:
- To propose an efficient phase delay calibration method for MEMS mirror-based LBS projectors.
- To enhance the accuracy of 3D topographic reconstruction by addressing fringe pattern distortions.
Main Methods:
- Development of a unique fringe projection sequence and a corresponding image processing algorithm for phase delay calibration.
- Implementation of the calibration method without requiring additional hardware components.
- Construction of an LBS projector utilizing a uniaxial electrostatic MEMS mirror (2.5 mm × 2.5 mm) with a 60° field of view at 1523 Hz resonance.
Main Results:
- The proposed method effectively compensates for phase uncertainty and variations in MEMS mirror-based LBS projectors.
- 3D reconstruction experiments demonstrated a significant improvement in accuracy.
- The standard deviation of sphere reconstruction was reduced from 2.05 mm to 0.20 mm after compensating for a 5 μs positive phase delay deviation.
Conclusions:
- The developed phase delay calibration method offers an efficient solution for unstable fringe patterns in LBS projectors.
- This technique enhances the precision of 3D topographic reconstruction without extra hardware.
- The results highlight the method's effectiveness in improving the reliability of MEMS-based FPP systems.

