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Photonics-Based Simultaneous DFS and AOA Measurement System without Direction Ambiguity.

Qingqing Meng1, Zihang Zhu1, Guodong Wang1

  • 1Information and Navigation College, Air Force Engineering University, Xi'an 710077, China.

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Summary

This study introduces a novel photonic system for simultaneously measuring microwave signal Doppler frequency shift (DFS) and angle of arrival (AOA). The system achieves unambiguous DFS and wide-ranging AOA measurements with high accuracy, enhancing electronic warfare capabilities.

Keywords:
Sagnac loopangle of arrivaldoppler frequency shiftmicrowave photonics

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Area of Science:

  • Photonics
  • Microwave Engineering
  • Signal Processing

Background:

  • Accurate measurement of Doppler frequency shift (DFS) and angle of arrival (AOA) is crucial for modern electronic warfare (EW) systems.
  • Existing methods often require multiple systems or suffer from ambiguity and limited range.

Purpose of the Study:

  • To propose and validate a novel, single photonic system capable of simultaneously measuring both DFS and AOA of microwave signals.
  • To achieve unambiguous DFS measurement and wide AOA measurement range with high accuracy.

Main Methods:

  • A Sagnac loop structure is employed at the signal receiving unit (SRU) to modulate echo and reference signals.
  • Signals are processed at the central station (CS) involving polarization control and photoelectric conversion.
  • Real-time DFS and AOA are acquired by monitoring the frequency and power of generated low-frequency electrical signals.

Main Results:

  • Simulations demonstrate unambiguous DFS measurement with errors as low as ±3 × 10-3 Hz.
  • A wide AOA measurement range from -90° to 90° with errors less than ±0.5° was successfully achieved.
  • The system simultaneously acquired both DFS and AOA in real-time.

Conclusions:

  • The proposed photonic system offers a compact, cost-effective solution for simultaneous DFS and AOA measurement.
  • The system exhibits enhanced stability and improved robustness, making it suitable for advanced EW applications.
  • This approach overcomes limitations of existing methods, providing unambiguous and wide-ranging measurements.