Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography

Michael Fahrbach1,2, Min Xu3, Wilson Ombati Nyang'au1,2,4

  • 1Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, Hans-Sommer-Straße 66, 38106 Braunschweig, Germany.