Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

3.9K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
3.9K
X-ray Crystallography02:18

X-ray Crystallography

24.0K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
24.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Bridging experiments and defects' mechanics: a data-driven toolbox for configurational force analysis.

Engineering with computers·2026
Same author

Imaging Sodium Dendrite Growth in All-Solid-State Sodium Batteries Using <sup>23</sup>Na <i>T</i><sub>2</sub>-Weighted Magnetic Resonance Imaging.

Angewandte Chemie (Weinheim an der Bergstrasse, Germany)·2024
Same author

Origin of age softening in the refractory high-entropy alloys.

Science advances·2023
Same author

Achieving Ultrahigh-Rate Planar and Dendrite-Free Zinc Electroplating for Aqueous Zinc Battery Anodes.

Advanced materials (Deerfield Beach, Fla.)·2022
Same author

Versailles project on advanced materials and standards (VAMAS) interlaboratory study on measuring the number concentration of colloidal gold nanoparticles.

Nanoscale·2022
Same author

Characterization of Solar-Aged Porous Silicon Carbide for Concentrated Solar Power Receivers.

Materials (Basel, Switzerland)·2021
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
Same journal

Temperature-dependent mean inner potential of polystyrene spheres measured using off-axis electron holography.

Ultramicroscopy·2026
See all related articles

Related Experiment Video

Updated: Aug 8, 2025

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

13.7K

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD).

Abdalrhaman Koko1, Vivian Tong2, Angus J Wilkinson3

  • 1Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom.

Ultramicroscopy
|March 5, 2023
PubMed
Summary
This summary is machine-generated.

Choosing the right reference pattern is crucial for precise high-resolution electron backscatter diffraction (HR-EBSD) strain mapping. An iterative algorithm optimizes this selection, improving accuracy in metals and silicon.

Keywords:
EBSDElectron microscopyHR-EBSDStrain measurement

More Related Videos

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

6.3K
Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

9.1K

Related Experiment Videos

Last Updated: Aug 8, 2025

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

13.7K
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

6.3K
Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

9.1K

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • High-resolution electron backscatter diffraction (HR-EBSD) is vital for analyzing material deformation.
  • The choice of reference diffraction pattern (EBSP₀) critically impacts strain and rotation map accuracy.
  • Previous studies have not fully addressed the impact of reference pattern selection on HR-EBSD precision.

Purpose of the Study:

  • To investigate the influence of reference pattern selection on HR-EBSD precision.
  • To develop a method for identifying the optimal reference pattern for HR-EBSD analysis.
  • To enhance the accuracy of strain and rotation mapping in various materials.

Main Methods:

  • Demonstration of the effect of reference pattern selection on plastically deformed metals (ferrite, austenite) and single-crystal silicon.
  • Identification of an empirical relationship between cross-correlation parameter and angular error.
  • Development and application of an iterative algorithm to find the optimal reference pattern.

Main Results:

  • Reference pattern selection significantly affects both the magnitude and spatial distribution of calculated strain and rotation.
  • An empirical relationship between cross-correlation and angular error was established.
  • The iterative algorithm successfully identified optimal reference patterns, maximizing HR-EBSD precision.

Conclusions:

  • Optimal reference pattern selection is essential for accurate HR-EBSD measurements.
  • The developed empirical relationship and iterative algorithm provide a robust method for improving HR-EBSD precision.
  • This approach is applicable to both ductile metals and brittle materials.