Related Experiment Video
Updated: Aug 7, 2025

Workflow and Tools for Crystallographic Fragment Screening at the Helmholtz-Zentrum Berlin
Published on: March 3, 2021
MAXPEEM: a spectromicroscopy beamline at MAX IV laboratory
Yuran Niu1, Nikolay Vinogradov1, Alexei Preobrajenski1
1MAX IV Laboratory, Lund University, Box 118, 22100 Lund, Sweden.
Abstract:
MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥1015 photons s-1 (0.1% bandwidth)-1 in the range 30-1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.
Related Concept Videos
UV–Vis Spectrometers
Overview of Electron Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Atomic Emission Spectroscopy: Instrumentation
Atomic Emission Spectroscopy: Lab
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....