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MAXPEEM: a spectromicroscopy beamline at MAX IV laboratory
Yuran Niu1, Nikolay Vinogradov1, Alexei Preobrajenski1
1MAX IV Laboratory, Lund University, Box 118, 22100 Lund, Sweden.
Journal of Synchrotron Radiation
|March 9, 2023
Summary
MAXPEEM at MAX IV Laboratory features an advanced aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This instrument provides nanoscale structural, chemical, and magnetic imaging with high photon flux and polarization control.
Area of Science:
- Materials Science
- Surface Science
- Spectroscopy
Background:
- MAXPEEM is a dedicated photoemission electron microscopy beamline at MAX IV Laboratory.
- It houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM).
Purpose of the Study:
- To introduce the capabilities of the MAXPEEM beamline and its AC-SPELEEM instrument.
- To highlight its advanced features for nanoscale imaging and analysis.
Main Methods:
- Utilizes an aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM).
- Operates with high photon flux (≥10^15 photons s^-1) in the 30-1200 eV range.
- Features full polarization control from an elliptically polarized undulator.
Main Results:
- Achieves single-digit nanometre spatial resolution.
- Offers complementary techniques for structural, chemical, and magnetic sensitivity.
- Incorporates an energy analyzer and aberration corrector for enhanced resolution and transmission.
- Employs a new fiber-coupled CMOS camera with improved performance over traditional detectors.
Conclusions:
- The MAXPEEM beamline and its AC-SPELEEM instrument represent a unique and powerful tool for advanced surface analysis.
- Its capabilities enable high-resolution, multi-modal investigation of materials at the nanoscale.
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