Angle-dependent spectral reflectance material dataset based on 945 nm time-of-flight camera measurements

Area of Science:

• Remote Sensing
• Material Science
• Spectroscopy

Background:

• Existing spectral reflectance libraries often lack angular resolution, limiting detailed material analysis.
• Understanding material reflectance across different angles is crucial for accurate remote sensing applications.

Purpose of the Study:

• To present a novel dataset of angle-dependent spectral reflectance measurements for various materials.
• To introduce a new measurement device and methodology for capturing angular reflectance data.
• To establish a comprehensive, categorized dataset for enhanced material identification.

Main Methods:

• Utilized a novel measurement device employing a 945 nm time-of-flight camera.
• Calibrated the device using Lambertian targets with known reflectance values (10%, 50%, 95%).
• Acquired spectral reflectance data from 0° to 80° in 10° increments, storing it in tabular format.

Main Results:

• Developed a dataset with angle-dependent spectral reflectance measurements.
• Implemented a novel, four-level material classification system for detailed categorization.
• Published the dataset open access on Zenodo (Record 7467552, Version 1.0.1) with 283 initial measurements.

Conclusions:

• The new dataset provides crucial angular resolution for spectral reflectance, improving upon existing libraries.
• The developed methodology and classification system offer a robust approach to material characterization.
• The open-access dataset is a valuable resource for research in remote sensing and material science, with ongoing updates.