Homogeneity and Thermal Stability of Sputtered Al0.7Sc0.3N Thin Films

José Manuel Carmona-Cejas1, Teona Mirea1, Jesús Nieto1

  • 1CEMDATIC-ETSI Telecomunicación, Universidad Politécnica de Madrid, Av. Complutense 30, 28040 Madrid, Spain.

Summary

This study investigated aluminum scandium nitride (AlScN) films, finding significant variations in piezoelectric activity across the wafer due to deposition conditions. Thermal stability was assessed, but improvements were limited.

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