Related Experiment Video
Updated: Aug 3, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle?
Gert Nolze1,2, Tomasz Tokarski3, Łukasz Rychłowski3
1Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.
Accurate crystal structure analysis from Kikuchi patterns is challenging. This study shows that even under ideal conditions, lattice parameter extraction has a systematic offset related to atomic number, impacting material characterization.
Area of Science:
- Materials Science
- Crystallography
- Diffraction Physics
Background:
- Deriving crystal structure and phase parameters from Kikuchi diffraction patterns relies on precise Bragg angle extraction.
- Automated analysis of Kikuchi patterns is crucial for reproducible crystallographic data.
Purpose of the Study:
- To investigate the accuracy and reproducibility of automated Bragg angle extraction from simulated Kikuchi patterns.
- To identify and quantify systematic errors in lattice parameter determination from Kikuchi diffraction.
Main Methods:
- Utilized the first derivative of the lattice profile to automatically determine band widths in simulated Kikuchi patterns.
- Analyzed the impact of various factors, including projection center, wavelength, and lattice plane traces, on lattice parameter accuracy.
Main Results:
- A linear offset in the mean lattice parameter distribution was observed, correlating with the mean atomic number (Z) of the material phase.
- Analyzing multiple Kikuchi bands reduces errors compared to single-band analysis.
- Higher image resolution, longer wavelengths, or higher interference orders offer diminishing returns in accuracy.
Conclusions:
- Automated lattice parameter determination from Kikuchi patterns is subject to a systematic error dependent on the material's atomic number.
- Careful consideration of band selection and pattern acquisition parameters is necessary for reliable crystallographic analysis.
More Related Videos
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
08:53Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092
Published on: October 2, 2017
Related Concept Videos
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
The de Broglie Wavelength