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Efficient and accurate projector calibration method based on phase-shifting method with sinusoidal structured light.

Wenguo Li¹, Yongpeng Zhong¹, Tao Liu¹

¹Faculty of Mechanical & Electrical Engineering, Kunming University of Science & Technology, Kunming, 650500, China.

|April 25, 2023

Summary

This summary is machine-generated.

This study introduces a novel projector calibration method using phase-shifting with sinusoidal structured light. The technique simplifies operations and enhances accuracy for 3D measurement systems.

Keywords:

Circular calibration board Phase-shifting method Projector calibration Structured light

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Area of Science:

Optics and Photonics
Computer Vision
Metrology

Background:

Projector calibration is crucial for 3D measurement accuracy.
Existing methods often suffer from complex procedures and low precision.
Structured light 3D measurement relies heavily on accurate projector calibration.

Purpose of the Study:

To propose a simplified and accurate projector calibration method.
To improve the precision of structured light 3D measurement.
To address the limitations of current projector calibration techniques.

Main Methods:

Utilizes phase-shifting with sinusoidal structured light.
Employs a circular calibration board and CCD camera.
Establishes pixel correspondence via phase information consistency.

Main Results:

Achieved a maximum reprojection error of 0.0419 pixels.
Attained an average reprojection error of 0.0343 pixels.
Demonstrated simple equipment requirements and ease of operation.

Conclusions:

The proposed method offers high calibration accuracy and efficiency.
It simplifies the operational complexity of projector calibration.
This technique is suitable for structured light 3D measurement applications.