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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
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Optical forces in heat-assisted magnetic recording head-disk interface
Roshan Mathew Tom1, Robert Smith2, Oscar Ruiz2
1Department of Mechanical Engineering, UC Berkeley, Berkeley, CA, 94720, USA. roshantom@berkeley.edu.
Scientific Reports
|May 25, 2023
Summary
Optical forces contribute to smear formation in Heat-Assisted Magnetic Recording (HAMR). Smear nanoparticle properties and interface conditions significantly influence these forces, impacting HAMR technology.
Area of Science:
- Physics
- Materials Science
- Nanotechnology
Background:
- Heat-Assisted Magnetic Recording (HAMR) faces challenges with contaminant buildup, known as smear, on the near-field transducer.
- Understanding smear formation is crucial for improving HAMR reliability and performance.
Purpose of the Study:
- To investigate the role of optical forces, specifically those from electric field gradients, in the formation of smear in HAMR.
- To compare optical forces with other forces like air drag and thermophoresis at the head-disk interface.
Main Methods:
- Theoretical approximations were used to model and compare forces acting on smear nanoparticles.
- Simulations were conducted to evaluate the force field's sensitivity to various parameters.
- Analysis focused on two distinct smear nanoparticle shapes.
Main Results:
- Optical forces originating from electric field gradients are a significant factor in smear formation.
- Smear nanoparticle properties such as refractive index, shape, and volume critically affect optical force magnitude.
- Interface conditions, including spacing and the presence of other contaminants, also influence the optical force.
Conclusions:
- Optical forces play a key role in the accumulation of smear on HAMR near-field transducers.
- Controlling nanoparticle properties and interface conditions can mitigate optical force-induced smear.
- This research provides insights for designing more robust HAMR systems by addressing contaminant buildup.
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