Resin comparison for serial block face scanning volume electron microscopy.

Area of Science:

• Microscopy
• Cell Biology
• Materials Science

Background:

• Serial Block Face Scanning Electron Microscopy (SBF-SEM) is a key volume electron microscopy (vEM) technique for 3D nanostructure analysis.
• Despite widespread adoption, few studies compare SBF-SEM specimen preparation parameters, particularly resin embedding.

Purpose of the Study:

• To survey the SBF-SEM literature for commonly used resins.
• To compare different resins for cellular and fixed tissue samples.
• To optimize SBF-SEM sample preparation for resin infiltration, charging/beam resistance, and image clarity.

Main Methods:

• Literature survey of SBF-SEM publications to identify prevalent resins.
• Comparative analysis of selected resins using cellular and fixed tissue samples.
• Evaluation of sample preparation based on resin infiltration, charging, beam damage, and image clarity.

Main Results:

• Identification of commonly used resins in SBF-SEM literature.
• Comparative data on resin performance in cellular and fixed tissue samples.
• Discussion of factors influencing optimal resin selection for SBF-SEM.

Conclusions:

• Resin choice significantly impacts SBF-SEM data quality and preparation efficiency.
• Optimizing resin embedding is crucial for effective 3D nanostructure visualization using SBF-SEM.
• This study provides guidance for selecting appropriate resins to enhance SBF-SEM imaging outcomes.