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Insights into the Semiconductor SERS Activity: The Impact of the Defect-Induced Energy Band Offset and Electron

Yinghao Xu1,2, Renli Chen3, Shenlong Jiang4

  • 1Institute of Photonics, Ningbo University, Ningbo, Zhejiang 315211, P. R. China.

ACS Applied Materials & Interfaces
|August 23, 2023
PubMed

Keywords:
carrier lifetimecharge transfer enhancementenergy bandsemiconductor oxidesurface-enhanced Raman scattering

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