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Simulation Methods for MEMS S&A Devices for 2D Fuze Overload Loading
Zhibo Wu1,2, Yanbing Zhang1,2, Chuanmeng Sun1,2
1School of Electrical and Control Engineering, North University of China, Taiyuan 030051, China.
Micromachines
|August 26, 2023
Summary
A new experimental system simulates two-dimensional (2D) fuze overload loading, addressing recoil and centrifugal overload issues in safety and arming (S&A) devices. This method accurately replicates high-g forces for fuze testing.
Area of Science:
- Mechanical Engineering
- Aerospace Engineering
- Materials Science
Background:
- Fuze safety and arming (S&A) devices require rigorous testing under extreme overload conditions.
- Existing testing methods face challenges in accurately simulating combined recoil and centrifugal overload scenarios.
Purpose of the Study:
- To design and validate an experimental testing system for simulating two-dimensional (2D) fuze overload loading.
- To address limitations in simulating recoil and centrifugal overload simultaneously in fuze S&A devices.
Main Methods:
- Developed a system integrating centrifuge rotation, impact acceleration simulation, and centrifugal rotation simulation.
- Established dynamic equations for the system and impact hammer motion.
- Utilized ANSYS/LS-DYNA for dynamic modeling and simulation of impact events.
- Performed 2D overload loading simulations and measured acceleration curves.
Main Results:
- The system successfully simulated recoil overload forces exceeding 10,000× g and centrifugal overload forces exceeding 1000× g.
- Feasibility of the proposed loading simulation method was verified through simulation and experimental tests.
- Acceleration curves were obtained, showing variations with centrifuge speed, cushion material, and buffer thickness.
Conclusions:
- The developed experimental system effectively simulates 2D fuze overload loading conditions.
- This provides a viable method for testing the reliability of fuze S&A devices under combined dynamic stresses.
- The system enhances safety and arming device development through accurate overload simulation.

