X-ray ptychographic and fluorescence microscopy using virtual single-pixel imaging based deconvolution with accurate...

Area of Science:

• Materials Science
• Microscopy
• Spectroscopy

Background:

• Simultaneous X-ray ptychography and fluorescence microscopy offer high-resolution, high-sensitivity analysis of microstructures and trace elements.
• Scanning Fluorescence X-ray Microscopy (SFXM) is a powerful technique for elemental mapping.

Purpose of the Study:

• To propose and validate a novel method for enhancing SFXM image quality.
• To improve the spatial resolution and reduce artifacts in SFXM imaging.

Main Methods:

• Deconvolution of SFXM images using virtual single-pixel imaging.
• Utilizing probe images from X-ray ptychographic reconstruction for each scanning point.
• Numerical simulations and synchrotron radiation experiments for validation.

Main Results:

• The proposed method significantly increased spatial resolution in SFXM images.
• Artifacts caused by probe imprecision (position errors, wavefront changes) were effectively suppressed.
• Successful application to observe sulfur element maps in ZnS particles.

Conclusions:

• The developed method enhances SFXM image quality, offering improved spatial resolution and artifact reduction.
• This technique is valuable for detailed microstructural and trace-elemental analysis in materials science.
• The approach demonstrates practical utility in experimental synchrotron radiation settings.