Related Experiment Video
Updated: Jul 16, 2025
A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals
Published on: May 10, 2018
In situ synchrotron X-ray total scattering measurements and analysis of colloidal CsPbX3 nanocrystals during flow
Matthew W Greenberg1, Cheng Hung Lin2, Shirish Chodankar2
1Department of Chemistry and Biochemistry, Bard College, 30 Campus Road, Annandale-on-Hudson, NY 12504, USA.
Abstract:
In situ X-ray scattering measurements of CsPbX3 (X = Cl, Br, I) nanocrystal formation and halide exchange at NSLS-II beamlines were performed in an automated flow reactor. Total scattering measurements were performed at the 28-ID-2 (XPD) beamline and small-angle X-ray scattering at the 16-ID (LiX) beamline. Nanocrystal structural parameters of interest, including size, size distribution and atomic structure, were extracted from modeling the total scattering data. The results highlight the potential of these beamlines and the measurement protocols described in this study for studying dynamic processes of colloidal nanocrystal synthesis in solution with timescales on the order of seconds.
