Fault Diagnosis in Analog Circuits Using Swarm Intelligence

Open or short-circuit faults, as well as discrete parameter faults, are the most commonly used models in the simulation prior to testing methodology. However, since analog circuits exhibit continuous responses to input signals, faults in specific circuit elements may not fully capture all potential component faults. Consequently, diagnosing faults in analog circuits requires three key aspects: identifying faulty components, determining faulty element values, and considering circuit tolerance constraints. To tackle this problem, a methodology is proposed and implemented for fault diagnosis using swarm intelligence. The investigated optimization techniques are Particle Swarm Optimization (PSO) and the Bat Algorithm (BA). In this methodology, the nonlinear equations of the tested circuit are employed to calculate its parameters. The primary objective is to identify the specific circuit component that could potentially exhibit the fault by comparing the responses obtained from the actual circuit and the responses obtained through the optimization process. Two circuits are used as case studies to evaluate the performance of the proposed methodologies: the Tow-Thomas Biquad filter (case study 1) and the Butterworth filter (case study 2). The proposed methodologies are able to identify or at least reduce the number of possible faulty components. Four main performance metrics are extracted: accuracy, precision, sensitivity, and specificity. The BA technique demonstrates superior performance by utilizing the maximum combination of accessible nodes in the tested circuit, with an average accuracy of 95.5%, while PSO achieved only 93.9%. Additionally, the BA technique outperforms in terms of execution time, with an average time reduction of 7.95% reduction for the faultless circuit and an 8.12% reduction for the faulty cases. Compared to the machine-learning-based approach, using BA with the proposed methodology achieves similar accuracy rates but does not require any datasets nor any time-demanding training to proceed with circuit diagnostic.