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A Multi-Dimensional Calibration Based on Genetic Algorithm in a 12-Bit 750 MS/s Pipelined ADC.
Hanbo Jia1, Xuan Guo1, Huaiyu Zhai1,2
1Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China.
This study introduces a multi-dimensional calibration technique using a genetic algorithm (GA) to enhance the accuracy of pipelined analog-to-digital converters (ADCs). The method significantly improves signal-to-noise ratio and dynamic range, crucial for high-speed applications.
Area of Science:
- Electrical Engineering
- Signal Processing
- Integrated Circuit Design
Background:
- Pipelined analog-to-digital converters (ADCs) are essential for high-speed and high-resolution data conversion.
- Accuracy in pipelined ADCs is primarily limited by errors from multiple digital-to-analog converters (MDACs), including capacitor mismatch and interstage gain errors (IGE).
Purpose of the Study:
- To develop and validate a multi-dimensional (M-D) MDAC calibration technique for a 12-bit 750 MS/s pipelined ADC.
- To compensate for static and dynamic errors in MDACs, thereby improving overall ADC performance.
Main Methods:
- Implementation of a multi-dimensional (M-D) MDAC compensation model incorporating a genetic algorithm (GA) for foreground calibration.
- Utilizing pseudo-random number (PN) injection for subsequent background calibration to address dynamic IGE.
- Development of an M-D coefficient extraction scheme based on GA to avoid local optima.
Main Results:
- The proposed calibration significantly improved performance in a prototype 12-bit 750 MS/s pipelined ADC.
- Signal-to-noise and distortion ratio (SNDR) increased from 49.9 dB to 59.6 dB, and spurious-free dynamic range (SFDR) improved from 66.7 dB to 77.5 dB at 25 °C.
- Background calibration further enhanced SNDR by 3.4 dB and SFDR by 8.8 dB at 85 °C.
Conclusions:
- The multi-dimensional MDAC calibration based on GA effectively compensates for capacitor mismatch and IGE in pipelined ADCs.
- The proposed technique enhances both static and dynamic performance, demonstrating its suitability for high-performance ADC applications.
- The method provides a robust solution for improving the accuracy of high-speed, high-resolution pipelined ADCs across varying temperatures.
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