Customization of an atomic force microscope for multidimensional measurements under environmental conditions

Area of Science:

• Surface science
• Nanotechnology
• Analytical chemistry

Background:

• Atomic force microscopy (AFM) offers nanometer-scale surface topography and property analysis.
• Standard AFM modes (contact, dynamic) provide topography but limited quantitative data.
• Advanced techniques like frequency modulation (FM) for high-resolution quantitative properties are not widely implemented.

Purpose of the Study:

• To demonstrate a step-by-step customization of a commercial atomic force microscope.
• To integrate advanced hardware and software for enhanced AFM capabilities.
• To showcase the performance of the upgraded system for advanced surface characterization.

Main Methods:

• Upgraded a commercial AFM with a lock-in amplifier, high-voltage amplifier, and new controller.
• Integrated new software for advanced measurement capabilities.
• Utilized existing environmental control features for temperature variation.

Main Results:

• Achieved high-resolution topography using frequency modulation (FM) AFM.
• Performed automated voltage/distance spectroscopy, time-resolved AFM, and 2D force spectroscopy.
• Demonstrated enhanced stability with active topography and frequency drift corrections.

Conclusions:

• The customized AFM system enables advanced quantitative surface property measurements.
• The methodology facilitates customization and automation of scanning probe microscopy systems.
• This work expands the application scope of AFM for detailed material analysis.