An integrated hinged dual-probe for co-target fast switching imaging

Area of Science:

• Nanotechnology
• Atomic Force Microscopy
• Surface Science

Background:

• Traditional atomic force microscopes (AFMs) use a single probe, limiting diverse applications on the same sample area.
• Replacing probes in conventional AFMs leads to loss of the target area, hindering sequential analysis.

Purpose of the Study:

• To design, simulate, fabricate, and demonstrate a novel dual-probe system for atomic force microscopy.
• To enable fast, in-situ switching between probes on the same sample area without losing spatial calibration.
• To facilitate multidimensional information acquisition from a single target using functionalized probes.

Main Methods:

• Development of an Integrated Hinged Dual-Probe (IHDP) with parallel cantilevers and a U-shaped hinged probe base.
• Simultaneous deflection signal sensing for both cantilevers using a single laser beam.
• Utilizing a piezoelectric ceramic actuator for rapid, precise probe switching with a 2 µm stroke.

Main Results:

• The IHDP system demonstrated precise manipulation and independent deflection signal sensing for each probe.
• Successful measurement and characterization capabilities were validated using standard grid samples.
• In-situ probe switching imaging on rat cardiomyocytes confirmed the system's superiority for sequential analysis of the same target area.

Conclusions:

• The IHDP offers a significant advancement in AFM technology, overcoming limitations of single-probe systems.
• Its rapid probe switching and multidimensional data acquisition capabilities enhance nanoscale research.
• The IHDP is poised to accelerate nanotechnology development by enabling more comprehensive surface analysis.