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Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the
Bo Kyung Cha1, Kyeong-Hee Lee1, Youngjin Lee2
1Precision Medical Device Research Center, Korea Electrotechnology Research Institute (KERI), 111 Hanggaul-ro, Sangnok-gu, Ansan-si 15588, Republic of Korea.
Sensors (Basel, Switzerland)
|December 23, 2023
Summary
This study optimizes X-ray image quality using the non-local means (NLM) algorithm to reduce noise in thin detectors. An optimized NLM algorithm (sigma=0.01) improves spatial resolution and noise levels for better imaging.
Area of Science:
- Medical Imaging
- Image Processing
- Detector Physics
Background:
- X-ray image quality is critically dependent on detector characteristics.
- Thinning X-ray detectors increases noise, while thicker detectors cause blurring and reduced target distinguishability.
- Existing methods struggle to balance noise reduction and spatial resolution in X-ray imaging.
Purpose of the Study:
- To derive optimal noise reduction parameters for enhanced X-ray image quality using the non-local means (NLM) algorithm.
- To investigate the impact of detector thickness on image noise and spatial resolution.
- To establish a new method for overcoming noise amplification in thin X-ray detector systems.
Main Methods:
- Utilized X-ray detectors of two thicknesses (96 and 140 μm) under the IEC 62220-1-1:2015 RQA-5 protocol.
- Calculated edge preservation index and signal-to-noise ratio to determine optimal NLM algorithm sigma values.
- Applied a no-reference image quality evaluator to assess overall image performance.
Main Results:
- An optimal sigma value of 0.01 was derived for the NLM algorithm.
- The optimized NLM algorithm successfully reduced noise and maintained spatial resolution in thin X-ray detectors.
- The proposed method achieved the best performance in the blind/referenceless image spatial quality evaluator assessment.
Conclusions:
- An optimized non-local means algorithm effectively overcomes noise amplification issues in thin X-ray detector systems.
- This new method significantly improves X-ray image quality by balancing noise reduction and spatial resolution.
- The optimized NLM algorithm holds potential for broad applications in various photon imaging fields.
