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Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....

Atomic Emission Spectroscopy: Instrumentation

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Preparation of Samples for Electron Microscopy

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Related Experiment Video

Updated: Jul 6, 2025

$Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction$

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

A simple, static and stage mounted direct electron detector based electron backscatter diffraction system.

Tianbi Zhang¹, T Ben Britton¹

¹Department of Materials Engineering, The University of British Columbia, 309-6350 Stores Road, Vancouver, BC V6T 1Z4, Canada.

Micron (Oxford, England : 1993)

|January 5, 2024

Summary

This summary is machine-generated.

This study introduces a compact, open-hardware Electron Backscatter Diffraction (EBSD) system for advanced materials characterization. The new design offers a simpler, more accessible alternative to commercial systems, promoting wider use of EBSD techniques.

Keywords:

Direct electron detection Electron backscattered diffraction (EBSD)

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Area of Science:

Materials Science
Crystallography
Analytical Chemistry

Background:

Advanced materials engineering relies on detailed microstructural characterization.
Electron Backscatter Diffraction (EBSD) is a key technique for generating microstructural maps via Kikuchi diffraction patterns.
Conventional EBSD systems often involve large, specialized detectors, limiting accessibility.

Purpose of the Study:

To present an accessible, open-hardware solution for Electron Backscatter Diffraction (EBSD).
To demonstrate a compact EBSD system with a simplified, static geometry.
To promote the use of open-source software and hardware in microstructural analysis.

Main Methods:

Developed a compact EBSD system using an off-the-shelf direct electron detector co-mounted with a sample.
Integrated microscope and detector control via software API.
Utilized open-source AstroEBSD software for diffraction pattern analysis.

Main Results:

The developed system features a simple, static geometry for improved diffraction analysis.
Successful demonstration of EBSD using line scan and area mapping experiments.
The open-hardware approach offers a cost-effective and accessible alternative.

Conclusions:

The presented compact EBSD system enhances accessibility to microstructural characterization.
This open-hardware solution can inspire simpler, more widespread EBSD system designs.
Promotes integration of open-source tools in materials science workflows.