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Sub-wavelength scale characterization of on-chip coupling mirrors.
Optics Express
|February 1, 2024
Summary
We created an automated platform to precisely measure miniature optical beams in 3D, including their polarization. This enables detailed analysis for optimizing integrated optical systems and micro-mirrors.
Area of Science:
- Optics and Photonics
- Micro-optics
- Integrated Optics
Background:
- Miniature free-space optical beams from on-chip microstructures lack standardized polarization state measurement.
- Characterizing these beams is crucial for advancing integrated optical systems.
Purpose of the Study:
- To develop an automated platform for 3D characterization of tightly focused free-space optical beams.
- To enable detailed analysis of beam properties, including polarization content and spatial confinement.
Main Methods:
- Development of an automated platform with subsystems for calibration and testing.
- Sub-wavelength resolution measurement of amplitude and phase using a cleaved fiber and heterodyne reference.
- Analysis of beam phase and intensity profiles concerning polarization and spatial confinement.
Main Results:
- Demonstration of a novel automated platform for comprehensive optical beam characterization.
- Successful measurement of amplitude and phase at sub-wavelength resolution.
- Proof-of-concept experiment showcasing the system's utility with a custom waveguide-coupled micro-mirror.
Conclusions:
- The developed platform offers rapid analysis capabilities for micro-mirrors.
- Enables optimization of integrated optical systems through detailed beam characterization.
- Opens new avenues for prototyping and development in micro-optics.
