Amorphous oxide semiconductor for monolithic 3D DRAM: an enabler or passer-by?
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Updated: Jul 4, 2025

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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
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Shujuan Mao1, Guilei Wang1, Chao Zhao1
1Beijing Superstring Academy of Memory Technology, China.
National Science Review
|February 5, 2024
Abstract:
Whether amorphous oxide semiconductor (AOS) is an enabler or pass-by for monolithic 3D DRAM is discussed, with current challenges and future directions proposed in this perspective.
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