Development of the multiplex imaging chamber at PAL-XFEL

Area of Science:

• Materials Science
• Physics
• Chemistry

Background:

• X-ray techniques are crucial for analyzing material structure and electronic properties.
• Simultaneous analysis of scattering and emission processes offers complementary information.
• Existing methods often require multiple instruments, limiting holistic system understanding.

Purpose of the Study:

• To develop and present a multiplex imaging instrument capable of simultaneous X-ray diffraction and X-ray emission spectroscopy.
• To enable holistic investigation of complex systems by combining structural and electronic information.
• To achieve nanoscale morphological, atomic-scale crystal arrangement, and electronic structure characterization.

Main Methods:

• Development of a multiplex imaging instrument.
• Simultaneous collection of small-/wide-angle X-ray diffraction (SAX/WAX) data.
• Simultaneous acquisition of X-ray emission spectra (XES).

Main Results:

• The instrument successfully collects complementary X-ray data simultaneously.
• Demonstrated capability for nanoscale morphological analysis.
• Achieved atomic-scale crystal arrangement and electronic structure determination.

Conclusions:

• The multiplex imaging instrument offers a powerful, integrated approach for comprehensive material characterization.
• Simultaneous X-ray diffraction and emission spectroscopy significantly enhances the understanding of complex systems.
• This technique advances nanoscale imaging and electronic structure analysis.