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Gate-Tunable Multiband van der Waals Photodetector and Polarization Sensor.

Daozhi Shen1,2,3, HeeBong Yang2,4, Tarun Patel2,5

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Area of Science:

  • Materials Science
  • Optoelectronics
  • Nanotechnology

Background:

  • Developing single photodetectors with tunable wavelengths and polarization sensitivity is challenging using traditional epitaxial films.
  • Multifunctional photosensors are crucial for diverse optical applications, including imaging, sensing, and telecommunications.

Purpose of the Study:

  • To engineer a multifunctional, high-performance photosensor using all van der Waals (vdW) materials.
  • To achieve gate-tunable spectral response and polarization sensitivity in a single device.

Main Methods:

  • Fabrication of a photodetector utilizing stacked van der Waals materials.
  • Electrical field manipulation of photocurrent generation in active layers.
  • Characterization of spectral response, polarization sensitivity, detectivity, and operation speed.

Main Results:

  • Demonstrated a gate-tunable spectral response switchable between near-infrared/visible and short-/midwave infrared at room temperature.
  • Achieved switchable linear polarization sensitivity (horizontal, vertical, nonpolarizing) in the telecommunication O-band.
  • Reported high detectivity (>10^9 cmHz^1/2W^-1) and fast operation speed (approx. 1 MHz).

Conclusions:

  • The developed vdW photodetector offers unprecedented multifunctionality and performance for optical applications.
  • The device's tunable spectral and polarization characteristics enable novel sensing and imaging capabilities.
  • Potential for dual visible and infrared imaging applications is highlighted.