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On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P.

Alejandro Fernández1, Pablo Zapico1, David Blanco1

  • 1Department of Construction and Manufacturing Engineering, University of Oviedo, 33203 Gijón, Asturias, Spain.

Sensors (Basel, Switzerland)
|June 19, 2024
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Summary
This summary is machine-generated.

This study integrates Laser Triangulation Sensors (LTS) for layer-wise 3D inspection in Material Extrusion (MEX) additive manufacturing. This approach enhances part quality control by enabling early detection of defects during the manufacturing process.

Keywords:
MEX/Padditive manufacturinglaser triangulationlayer-wise scanning

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Area of Science:

  • Additive Manufacturing
  • Metrology
  • Quality Control

Background:

  • Material Extrusion (MEX) is a leading additive manufacturing (AM) process, but quality deficiencies hinder widespread industrial use.
  • Current quality control methods in MEX are complex, affecting mechanical properties, surface finish, and dimensional accuracy.
  • Early-stage process monitoring is crucial for improving MEX part quality.

Purpose of the Study:

  • To explore the integration of Laser Triangulation Sensors (LTS) into MEX equipment for layer-wise 3D inspections.
  • To develop an autonomous system for digitizing and reconstructing layer topography.
  • To assess layer quality uniformity using standardized indicators and a novel approach.

Main Methods:

  • Implementation of a double-bridge architecture for an LTS-based inspection system.
  • Independent operation of the inspection system from the MEX manufacturing process.
  • Computation of surface texture using standardized indicators and a new uniformity assessment method.

Main Results:

  • Demonstrated the efficacy of the integrated LTS approach for layer quality characterization through a case study.
  • Successfully evaluated two alternative extruder head designs.
  • Provided a method for autonomous reconstruction of layer topography.

Conclusions:

  • Integrated layer-wise inspection using LTS can significantly mitigate quality issues in MEX manufacturing.
  • This approach enables optimization of process parameters for enhanced performance.
  • The developed system facilitates comprehensive digitization and autonomous reconstruction for improved quality control.