Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.2K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.2K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Transcriptomic and Metabolomic Profiling Reveals Differential Responses of Soybean Germination to Neutral and Alkaline Salt Stresses.

Biology·2026
Same author

Reduction of Liftoff Effect in Eddy Current Measurement of Electrical Conductivity Using Multi-Frequency Excitation.

Sensors (Basel, Switzerland)·2026
Same author

The Research on Path Planning Method for Detecting Automotive Steering Knuckles Based on Phased Array Ultrasound Point Cloud.

Sensors (Basel, Switzerland)·2025
Same author

Coil-Only High-Frequency Lamb Wave Generation in Nickel Sheets.

Sensors (Basel, Switzerland)·2024
Same author

Bottom Crack Detection with Real-Time Signal Amplitude Correction Using EMAT-PEC Composite Sensor.

Sensors (Basel, Switzerland)·2024
Same author

Research on Alternating Current Field Measurement Method for Buried Defects of Titanium Alloy Aircraft Skin.

Sensors (Basel, Switzerland)·2024

Related Experiment Video

Updated: Jun 23, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K

Evaluation of Depth Size Based on Layered Magnetization by Double-Sided Scanning for Internal Defects.

Zhiyang Deng1, Dingkun Qian1, Haifei Hong1

  • 1Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan 430068, China.

Sensors (Basel, Switzerland)
|June 19, 2024
PubMed
Summary
This summary is machine-generated.

This study introduces a new magnetic method to accurately measure internal defect depths in steel pipes. By layering magnetization, it precisely determines defect dimensions, improving safety and reducing material waste.

Keywords:
defect size evaluationferromagnetic materialmagnetic permeability perturbationstepped magnetization

More Related Videos

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
07:42

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Published on: July 20, 2022

2.7K
Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide
09:44

Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide

Published on: May 23, 2025

48

Related Experiment Videos

Last Updated: Jun 23, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K
Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
07:42

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Published on: July 20, 2022

2.7K
Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide
09:44

Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide

Published on: May 23, 2025

48

Area of Science:

  • Materials Science
  • Non-Destructive Testing
  • Electromagnetism

Background:

  • Accurate defect depth evaluation is crucial for preventing harm and economic losses, particularly for internal defects in ferromagnetic materials.
  • Magnetic Permeability Perturbation Testing (MPPT) is effective for thick-walled steel pipes, but determining defect depth from single time-domain signals is challenging.

Purpose of the Study:

  • To develop a novel magnetic method for precisely quantifying internal defect depths in ferromagnetic materials.
  • To overcome the limitations of traditional MPPT in defect depth assessment.

Main Methods:

  • Investigated magnetization layering in ferromagnetic materials under unsaturated magnetizing fields.
  • Utilized step magnetization to achieve different magnetization depths.
  • Employed finite element simulations to establish relationships between magnetization currents and depths.
  • Applied a double-sided scan technique to localize defect boundaries.

Main Results:

  • Successfully established magnetization characteristic current-depth relationships via simulations.
  • Demonstrated the capability to detect spatial properties of layered magnetization.
  • Experimentally evaluated defects with a 2 mm depth size.
  • Achieved a maximum relative error of 5% in experimental evaluations.

Conclusions:

  • The proposed method enables accurate determination of internal defect depth sizes in ferromagnetic materials.
  • Layered magnetization and double-sided scanning effectively localize defect boundaries.
  • This technique offers a significant improvement for defect evaluation in thick-walled steel pipes.