Non-Destructive Analysis of Subvisible Particles with Mie-Scattering-Based Light Sheet Technology: System

Mingshu Liang1, Monica Goss2, Shawn Cao2

  • 1California Institute of Technology, Electrical Engineering, Pasadena, CA 91125, USA.

Summary

A new non-destructive analyzer detects subvisible particles (SbVPs) in drug products without damaging samples. This method accurately quantifies particle size and concentration in intact vials, improving pharmaceutical quality control.