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A 25 Mbps 15 ns Propagation Delay 150 kV/μs CMTI Configurable Dual-Channel Capacitive Digital Isolation Driver.
Yuan Zhao1,2, Liang Wang2, Zhifeng Chen1
1School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
This study introduces a new capacitive digital isolator for efficient power supplies. It offers high common-mode transient immunity (CMTI) and a 25 Mbps data rate, enhancing system reliability in demanding environments.
Area of Science:
- Electrical Engineering
- Semiconductor Devices
- Power Electronics
Background:
- Electrical isolation is critical for electronic system reliability, especially in harsh conditions.
- Digital isolators are prevalent in low-power circuits for their disturbance immunity.
- High-efficiency power supplies require robust isolation solutions capable of high data rates and transient immunity.
Purpose of the Study:
- To propose a novel capacitive digital isolator architecture.
- To achieve high common-mode transient immunity (CMTI) and high data transmission rates for power supply applications.
- To enhance the drive capacity and reduce propagation delay in digital isolators.
Main Methods:
- Utilizing on-off keying (OOK) modulation for high-speed, accurate signal transmission.
- Developing a fully integrated high-voltage level-shift driver with nanosecond-scale delay.
- Implementing and simulating the proposed architecture using Cadence IC 6.1.7 with a standard 0.18 μm CMOS process.
Main Results:
- Achieved a data transmission rate of 25 Mbps.
- Demonstrated a typical propagation delay of 15 ns.
- Realized a common-mode transient immunity (CMTI) exceeding 150 kV/μs.
- Obtained output peak currents of 2 A and 4 A.
Conclusions:
- The proposed capacitive digital isolator effectively meets the demands of high-efficiency power supply scenarios.
- The design provides a significant improvement in CMTI and data transmission speed compared to existing solutions.
- This architecture is suitable for applications requiring reliable operation under harsh electrical conditions.
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