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Changes in surface topography of Candida albicans during morphogenesis.
Sabouraudia
|October 1, 1985
Summary
Scanning electron microscopy revealed that extensive vacuolation in Candida albicans yeast cells can cause cell wall collapse during preparation. This artifact was not observed in yeast cells grown under conditions that suppress germ tube formation.
Area of Science:
- Microbiology
- Cell Biology
- Microscopy
Background:
- Candida albicans is an opportunistic fungal pathogen.
- Germ tube formation is a key virulence factor in C. albicans.
- Specimen preparation for electron microscopy can introduce artifacts.
Purpose of the Study:
- To investigate the cause of cell wall collapse in Candida albicans during electron microscopy specimen preparation.
- To identify conditions that prevent this preparation artifact.
Main Methods:
- Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were used.
- Candida albicans cells were cultured under conditions promoting and suppressing germ tube formation.
- Cells underwent standard specimen preparation protocols for electron microscopy.
Main Results:
- Extensive vacuolation and potential cell wall alterations were observed in germ-tube forming cells.
- Cell wall collapse was a common artifact in germ-tube forming Candida albicans.
- Cells grown under suppressed germ tube formation conditions did not exhibit cell wall collapse.
Conclusions:
- Extensive vacuolation and associated cellular changes likely cause cell wall collapse during specimen preparation of germ-tube forming Candida albicans.
- Suppressing germ tube formation in C. albicans prevents this preparation artifact.