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Published on: October 23, 2018
Plasma-free anisotropic selective-area etching of β-Ga2O3 using forming gas under atmospheric pressure
Takayoshi Oshima1, Rie Togashi2, Yuichi Oshima1
1Research Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, Japan.
Abstract:
We demonstrate a facile and safe anisotropic gas etching technique for β-Ga2O3 under atmospheric pressure using forming gas, a H2/N2 gas mixture containing 3.96 vol% H2. This etching gas, being neither explosive nor toxic, can be safely exhausted into the atmosphere, simplifying the etching system setup. Thermodynamic calculations confirm the viability of gas-phase etching above 676°C without the formation of Ga droplets. Experimental verification was achieved by etching ( 02) β-Ga2O3 substrates within a temperature range of 700-950°C. Moreover, selective-area etching using this method yielded trenches and fins with vertical and flat sidewalls, defined by (100) facets with the lowest surface energy density, demonstrating significant anisotropic etching capability.

