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In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction

Gudrun Lotze1, Anand H S Iyer2, Olof Bäcke2

  • 1MAX IV Laboratory, Lund, Sweden.

Journal of Synchrotron Radiation
|August 6, 2024
PubMed

Keywords:
in situ deformationnanodiffractionnanoindentationsample environmentstress mapping

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