Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of

Zhigui Zhang1, Pengzu Kou1, Yu Chen1

  • 1School of Materials Science and Engineering, Northeastern University, Shenyang 110819, PR China; School of Resources and Materials, Northeastern University at Qinhuangdao, Qinhuangdao 066004, PR China.

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