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Frontier system-on-chip (SoC) technology for microwave diagnostics (invited).

Ying Chen1, Pin-Jung Chen1, Robert Hu2

  • 1University of California, Davis, California 95616, USA.

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System-on-chip (SoC) technology advances microwave diagnostics for fusion energy. This innovation enables smaller, more reliable systems, crucial for next-generation fusion power plants and improving plasma measurements.

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Area of Science:

  • Nuclear Fusion Engineering
  • Applied Microwave Engineering
  • Plasma Diagnostics

Background:

  • Next-generation fusion reactors require advanced diagnostic systems to prove electricity generation viability.
  • Increased neutron flux in future reactors necessitates reduced vessel penetrations and elimination of internal diagnostics.
  • Existing microwave diagnostics face challenges due to space and reliability constraints in harsh fusion environments.

Purpose of the Study:

  • To develop miniaturized, modular, and reliable microwave diagnostic systems for fusion reactors using System-on-Chip (SoC) technology.
  • To demonstrate the practical application and effectiveness of SoC-based microwave diagnostics in operational fusion devices.
  • To advance higher frequency capabilities for fusion diagnostics through novel SoC development.

Main Methods:

  • Pioneered a seven-year research effort culminating in the V- and W-band system-on-chip (SoC) approach.
  • Developed and implemented active transmitter and passive receiver SoC modules in the DIII-D tokamak.
  • Utilized arrays of SoC modules to support microwave imaging diagnostics and Electron Cyclotron Emission Imaging.
  • Achieved breakthrough development of an F-band SoC for higher frequency applications.

Main Results:

  • Successfully deployed V- and W-band SoC modules in the DIII-D tokamak, supporting microwave imaging diagnostics.
  • Electron Cyclotron Emission Imaging system on DIII-D provided new physics measurement results, demonstrating improved diagnostic capabilities.
  • Developed a novel F-band SoC, extending frequency range for future fusion device diagnostics.

Conclusions:

  • System-on-Chip (SoC) technology significantly enhances the reliability, miniaturization, and integration of microwave diagnostic systems for fusion energy.
  • The developed SoC-based diagnostics have proven effective in practical applications, improving plasma measurements in fusion devices like DIII-D.
  • These advancements represent a substantial step towards reliable and efficient plasma diagnostics essential for future fusion power plants.