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The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy

Peter Ercius1, Ian J Johnson2, Philipp Pelz1

  • 1National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 19, 2024
PubMed

Keywords:
4D-STEMactive pixel sensordirect electron detectorphase contrast STEMscanning transmission electron microscopy

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