Electronic angle focusing for neutron time-of-flight powder diffractometers
1Advanced Photon Source Argonne National Laboratory 9700 South Cass Avenue Lemont IL60439-4814 USA.
Abstract:
A neutron time-of-flight (TOF) powder diffractometer with a continuous wide-angle array of detectors can be electronically focused to make a single pseudo-constant wavelength diffraction pattern, thus facilitating angle-dependent intensity corrections. The resulting powder diffraction peak profiles are affected by the neutron source emission profile and resemble the function currently used for TOF diffraction.
More Related Videos
08:48High-Resolution Neutron Spectroscopy to Study Picosecond-Nanosecond Dynamics of Proteins and Hydration Water
Published on: April 28, 2022
07:24Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Related Concept Videos
Mass Analyzers: Common Types
Mass Analyzers: Overview
Atomic Emission Spectroscopy: Instrumentation
