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Artifacts and Anomalies in Raman Spectroscopy: A Review on Origins and Correction Procedures
Ravi Teja Vulchi1, Volodymyr Morgunov1, Rajendhar Junjuri1
1Institute of Physical Chemistry (IPC) and Abbe Center of Photonics (ACP), Friedrich Schiller University Jena, Member of the Leibniz Centre for Photonics in Infection Research (LPI), Helmholtzweg 4, 07743 Jena, Germany.
This review examines artifacts in Raman spectroscopy measurements, detailing their origins and impacts. It categorizes correction methods, including computational, experimental, and deep learning approaches, to improve spectral analysis.
Area of Science:
- Analytical Chemistry
- Spectroscopy
- Materials Science
Background:
- Raman spectroscopy offers molecular fingerprinting but is susceptible to artifacts.
- Instrumental, sampling, and sample-related factors introduce anomalies affecting spectral data.
- Accurate spectral analysis is crucial for industrial and academic applications.
Purpose of the Study:
- To review the origins and impacts of artifacts in Raman spectroscopy.
- To categorize and present existing correction procedures for Raman spectral anomalies.
- To identify limitations and highlight advancements in spectral correction techniques.
Main Methods:
- Comprehensive literature review of artifact origins and impacts.
- Categorization of correction procedures: computational, experimental, and deep learning (DL).
- Analysis of current limitations and recent breakthroughs in correction methodologies.
Main Results:
- Detailed discussion on factors causing Raman spectral artifacts.
- A structured overview of diverse artifact correction strategies.
- Identification of emerging DL-based methods for enhanced spectral accuracy.
Conclusions:
- Current correction procedures have limitations that require further research.
- Recent advancements show promise for improving Raman spectral data quality.
- Future research should focus on developing robust and efficient correction techniques.
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