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Updated: Jun 10, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Limeng Song1,2,3, Linan Wang1,3, Yongqiang Chen1
1School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, China.
Researchers developed a new method to improve electromagnetic wave (EMW) absorption in silicon carbide (SiC) nanofibers by precisely controlling SiO2 shell thickness. This technique enhances EMW absorption performance for advanced applications.
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