Atomic Force Microscopy
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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Xueping Zou1, Daniel C Spencer1, Junyu Chen1
1School of Electronics and Computer Science Southampton SO17 1BJ UK.
A new deformability cytometer measures cell shape changes optically and electrically. This innovative system shows excellent correlation between both methods for precise cell analysis.
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