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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy.

Felipe F Morgado1, Leigh T Stephenson1, Shalini Bhatt1

  • 1Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 13, 2024
PubMed
Summary
This summary is machine-generated.

Tungsten (W) atoms segregate to stacking faults (SFs) in nickel alloys, enhancing strength. This W segregation differs from rhenium (Re) and impacts alloy design for cost reduction.

Keywords:
analytic bond-order potentialanalytical field ion microscopyatom probe tomographyatomic resolutionstacking fault segregationtime-of-flight spectrometry

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Area of Science:

  • Materials Science
  • Metallurgy
  • Nanotechnology

Background:

  • Stacking faults (SFs) are critical structural defects influencing the mechanical properties of engineering alloys.
  • Atomic-scale imaging of SFs and associated solute segregation presents significant challenges.
  • Understanding solute-defect interactions is vital for designing advanced high-performance alloys.

Purpose of the Study:

  • To directly image and identify elemental segregation at stacking faults in a creep-deformed Ni-W alloy.
  • To quantitatively analyze trajectory aberrations that limit resolution in atom probe tomography.
  • To elucidate the atomistic mechanisms governing tungsten segregation at stacking faults.

Main Methods:

  • Analytical field ion microscopy (FIM) with density functional theory (DFT)-informed contrast estimation.
  • Time-of-flight spectrometry for elemental identification.
  • Atomistic simulations using analytic bond-order potentials for segregation analysis.

Main Results:

  • Direct atomic-scale imaging revealed local elemental segregation at SFs in a Ni-2 at% W alloy.
  • Tungsten (W) atoms were identified as the segregating species, appearing as bright spots in FIM.
  • Quantitative analysis showed trajectory aberrations of ~0.4 nm, explaining limitations of atom probe tomography.
  • Simulations confirmed W's energetic preference for the SF core, contrasting with Re segregation to partial dislocations.

Conclusions:

  • Tungsten segregation to stacking faults in Ni-based alloys is experimentally confirmed and mechanistically understood.
  • This segregation differs significantly from rhenium and impacts the strengthening mechanisms in superalloys.
  • Alloy design aiming to substitute Re with W requires careful consideration of their distinct interactions with structural defects.