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    This study optimized array slits and linear CCDs to reduce aliasing noise, achieving nanoradian-level angular measurement resolution and stability with fewer components.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Signal Processing

    Background:

    • Array slits imaging and linear Charge-Coupled Device (CCD) acquisition are crucial for high-resolution measurements.
    • Aliasing noise in imaging systems can degrade measurement accuracy and stability.
    • Traditional methods often require complex setups for achieving nanoradian-level precision.

    Purpose of the Study:

    • To develop a mathematical model for understanding array slits imaging and linear CCD acquisition.
    • To investigate the relationship between system parameters and spot image aliasing noise using frequency domain analysis.
    • To reduce aliasing noise and enhance angular measurement resolution and stability.

    Main Methods:

    • Development of a detailed mathematical model for array slits imaging and linear CCD acquisition.
    • Frequency domain analysis to identify sources of aliasing noise.
    • Optimization of array slits design and linear CCD parameters.

    Main Results:

    • Identified the relationship between system parameters and spot image aliasing noise.
    • Successfully reduced aliasing noise through optimized design and parameter selection.
    • Achieved nanoradian-level angular measurement resolution and stability using only 8 array slits.
    • Demonstrated an angular measurement resolution of 0.0005 arcsec over a ±400 arcsec range.
    • Obtained static repeatability of 0.0003 arcsec and stability of 0.0061 arcsec over 2 hours.

    Conclusions:

    • Optimized array slits and linear CCD parameters significantly reduce aliasing noise.
    • The developed method offers a more efficient approach to achieving high-resolution angular measurements.
    • This technique enables nanoradian-level precision with a simplified system configuration.