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Implementation of a Reference Interferometer for Nanodetection

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Refractive index measurement for plane parallel plate using fiber point diffraction lateral interference and

Zimo Zhao, Lingfeng Chen, Xusheng Zhang

|November 22, 2024

Summary

A novel method accurately measures refractive index (RI) using fiber point light sources and lateral interferometry. This technique achieves high precision (10^-4) with a simple setup for optical measurements.

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Area of Science:

Optics and Photonics
Materials Science
Metrology

Background:

Accurate refractive index (RI) measurement is crucial for material characterization.
Traditional methods often involve complex optical setups and multiple components.

Purpose of the Study:

To propose and validate a simple, high-accuracy RI measurement method for plane-parallel-plates (PPP).
To leverage fiber point light sources (PLSs) and lateral interferometry for RI determination.

Main Methods:

Utilizing two fiber PLSs to generate lateral interference patterns through a PPP sample.
Collecting interferograms with a linear array camera (LAC).
Developing a theoretical model via ray tracing and numerical simulation, incorporating polynomial fitting, PPP thickness, and phase changes.

Main Results:

Achieved a refractive index measurement accuracy of 10^-4.
Demonstrated a simplified optical setup excluding intermediate components.
Validated the simulation model through correction with known RI samples.

Conclusions:

The proposed method offers a straightforward and accurate approach for RI measurement.
The technique's simplicity and high accuracy make it suitable for various optical applications.
The numerical simulation and correction strategy enhance measurement precision.